// SPDX-License-Identifier: GPL-2.0-only /* Unit tests for IIO light sensor gain-time-scale helpers * * Copyright (c) 2023 Matti Vaittinen <[email protected]> */ #include <kunit/device.h> #include <kunit/test.h> #include <linux/device.h> #include <linux/iio/iio-gts-helper.h> #include <linux/iio/types.h> /* * Please, read the "rant" from the top of the lib/test_linear_ranges.c if * you see a line of helper code which is not being tested. * * Then, please look at the line which is not being tested. Is this line * somehow unusually complex? If answer is "no", then chances are that the * "development inertia" caused by adding a test exceeds the benefits. * * If yes, then adding a test is probably a good idea but please stop for a * moment and consider the effort of changing all the tests when code gets * refactored. Eventually it neeeds to be. */ #define TEST_TSEL_50 … #define TEST_TSEL_X_MIN … #define TEST_TSEL_100 … #define TEST_TSEL_200 … #define TEST_TSEL_400 … #define TEST_TSEL_X_MAX … #define TEST_GSEL_1 … #define TEST_GSEL_X_MIN … #define TEST_GSEL_4 … #define TEST_GSEL_16 … #define TEST_GSEL_32 … #define TEST_GSEL_64 … #define TEST_GSEL_256 … #define TEST_GSEL_512 … #define TEST_GSEL_1024 … #define TEST_GSEL_2048 … #define TEST_GSEL_4096 … #define TEST_GSEL_X_MAX … #define TEST_SCALE_1X … #define TEST_SCALE_MIN_X … #define TEST_SCALE_2X … #define TEST_SCALE_4X … #define TEST_SCALE_8X … #define TEST_SCALE_16X … #define TEST_SCALE_32X … #define TEST_SCALE_64X … #define TEST_SCALE_NANO_128X … #define TEST_SCALE_NANO_256X … #define TEST_SCALE_NANO_512X … #define TEST_SCALE_NANO_1024X … #define TEST_SCALE_NANO_2048X … #define TEST_SCALE_NANO_4096X … #define TEST_SCALE_NANO_4096X2 … #define TEST_SCALE_NANO_4096X4 … #define TEST_SCALE_NANO_4096X8 … #define TEST_SCALE_NANO_MAX_X … /* * Can't have this allocated from stack because the kunit clean-up will * happen only after the test function has already gone */ static struct iio_gts gts; /* Keep the gain and time tables unsorted to test the sorting */ static const struct iio_gain_sel_pair gts_test_gains[] = …; static const struct iio_itime_sel_mul gts_test_itimes[] = …; #define TOTAL_GAIN_MAX … #define IIO_GTS_TEST_DEV … static struct device *__test_init_iio_gain_scale(struct kunit *test, struct iio_gts *gts, const struct iio_gain_sel_pair *g_table, int num_g, const struct iio_itime_sel_mul *i_table, int num_i) { … } #define test_init_iio_gain_scale(test, gts) … static void test_init_iio_gts_invalid(struct kunit *test) { … } static void test_iio_gts_find_gain_for_scale_using_time(struct kunit *test) { … } static void test_iio_gts_find_new_gain_sel_by_old_gain_time(struct kunit *test) { … } static void test_iio_find_closest_gain_low(struct kunit *test) { … } static void test_iio_gts_total_gain_to_scale(struct kunit *test) { … } static void test_iio_gts_chk_times(struct kunit *test, const int *vals) { … } static void test_iio_gts_chk_scales_all(struct kunit *test, struct iio_gts *gts, const int *vals, int len) { … } static void test_iio_gts_chk_scales_t200(struct kunit *test, struct iio_gts *gts, const int *vals, int len) { … } static void test_iio_gts_avail_test(struct kunit *test) { … } static struct kunit_case iio_gts_test_cases[] = …; static struct kunit_suite iio_gts_test_suite = …; kunit_test_suite(…) …; MODULE_LICENSE(…) …; MODULE_AUTHOR(…) …; MODULE_DESCRIPTION(…) …; MODULE_IMPORT_NS(…);
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