chromium/v8/test/unittests/heap/bitmap-unittest.cc

// Copyright 2015 the V8 project authors. All rights reserved.
// Use of this source code is governed by a BSD-style license that can be
// found in the LICENSE file.

#include "src/common/globals.h"
#include "src/heap/marking-inl.h"
#include "src/heap/spaces.h"
#include "test/unittests/heap/bitmap-test-utils.h"
#include "testing/gtest/include/gtest/gtest.h"

namespace v8::internal {

constexpr MarkBit::CellType kMarkedCell =;
constexpr MarkBit::CellType kLowerHalfMarkedCell =;
constexpr MarkBit::CellType kHigherHalfMarkedCell =;
constexpr MarkBit::CellType kWhiteCell =;
constexpr uint8_t kMarkedByte =;
constexpr uint8_t kUnmarkedByte =;

NonAtomicBitmapTest;
AtomicBitmapTest;

TEST_F(NonAtomicBitmapTest, IsZeroInitialized) {}

TEST_F(NonAtomicBitmapTest, Cells) {}

TEST_F(NonAtomicBitmapTest, CellsCount) {}

TEST_F(NonAtomicBitmapTest, IsClean) {}

namespace {

template <AccessMode access_mode>
void ClearTest(uint8_t* raw_bitmap, MarkingBitmap* bm) {}

template <AccessMode access_mode>
void ClearRange1Test(uint8_t* raw_bitmap, MarkingBitmap* bm) {}

template <AccessMode access_mode>
void ClearRange2Test(uint8_t* raw_bitmap, MarkingBitmap* bm) {}

template <AccessMode access_mode>
void SetAndClearRangeTest(uint8_t* raw_bitmap, MarkingBitmap* bm) {}

}  // namespace

TEST_F(AtomicBitmapTest, Clear) {}

TEST_F(NonAtomicBitmapTest, Clear) {}

TEST_F(AtomicBitmapTest, ClearRange1) {}

TEST_F(NonAtomicBitmapTest, ClearRange1) {}

TEST_F(AtomicBitmapTest, ClearRange2) {}

TEST_F(NonAtomicBitmapTest, ClearRange2) {}

TEST_F(AtomicBitmapTest, SetAndClearRange) {}

TEST_F(NonAtomicBitmapTest, SetAndClearRange) {}

// AllBitsSetInRange() and AllBitsClearInRange() are only used when verifying
// the heap on the main thread so they don't have atomic implementations.
TEST_F(NonAtomicBitmapTest, ClearMultipleRanges) {}

}  // namespace v8::internal